Improving Detectability of Resistive Open Defects in FPGA
نویسندگان
چکیده
This paper presents a new technique for detecting resistive open defects in FPGAs. This technique is based on the reconfigurability feature of FPGAs. Using this technique, the detectability of the defect can be improved by several orders of magnitude. Also, a method is developed to scale the detectability. Simulation results show the effectiveness of this method.
منابع مشابه
Improving Detectability of Resistive Open Defects in FPGAs
This paper presents a new technique for detecting resistive open defects in FPGAs. This technique is based on the reconfigurability feature of FPGAs. Using this technique, the detectability of a defect can be improved by several orders of magnitude. Also, a method is developed to scale the detectability. Simulation results show the effectiveness of this method.
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